September 10, 2013
Speaker: Prof. Robert A. Reed, Dept. of Electrical Engineering and Computer Science, Vanderbilt University
Forty five years of scientific research and engineering excellence has led to several fabrication and integration methods enabling the microelectronic industry to sustain the trends inferred by Moore's Law. This increase in complexity is a key enabling principle for advancing information systems into the modern age and beyond. Among the development techniques are those for mitigating effects produced when radiation events produced by environments such as galactic cosmic rays pass through microelectronic components. These ionizing particles liberate charge in undesirable locations within the semiconductor. The motion of this charge produces spurious signals in the circuitry of the IC. If this signal occurs on specific sensitive nodes and/or within a specific sensitive time window, then the logic state of the circuit will spontaneously change state. This logic state change is known as a soft error.
Robert A. Reed received his Ph.D. in Physics from Clemson University in 1994. He subsequently worked at the Naval Research Laboratory and Hughes Space and Communication. Between 1997 and 2004, Robert was a research physicist at NASA Goddard Space Flight Center, where he supported NASA space flight and research programs. He is currently a Professor of Electrical Engineering at Vanderbilt University. His radiation effects research activities have included topics such as single event effect, basic mechanisms of displacement damage, and on-orbit performance analysis and prediction techniques. He has authored over 170 papers on various topics in the radiation effects area that have garnered more than 1400 citations and 10 paper awards. He received the 2004 Early Achievement Award from IEEE/NPSS and the 2000 Outstanding Young Alumni Award from Clemson University. Robert has been active in the Nuclear and Space Radiation Effects community since 1992; he has served as 2016 General Chair, 2011 Technical Program Chairman, 2006 Short Course Chairman, and 2000 and 2008 Short Course Instructor. He is currently a member of the IEEE/NPSS Administrative Committee.