Electrostatic Discharge (ESD) Protection in Si BCD and GaN Technologies

October 4, 2013
11:00am-12:00pm
1021 CEPSR
Speaker: Prof. Juin J. Liou, University of Central Florida

Abstract

Electrostatic discharge (ESD) is one of the most prevalent threats to electronic components. It is an event in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and more than 35% of chip damages can be attributed to such an event. As such, designing on-chip ESD structures to protect integrated circuits against the ESD stress is a high priority in the semiconductor industry. The continuing advancement of MOS technology makes the ESD-induced failures even more prominent, and one can predict with certainty that the availability of effective and robust ESD protection solutions will become a critical and essential component to the successful commercialization of the modern and future MOS-based electronics.

A brief ESD overview will first be given in this talk. This is followed by presenting the approaches and challenges of designing and realizing ESD protection solutions for high-voltage integrated circuits in the Si BCD and emerging GaN technologies.

Speaker Bio

Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida where he is now the UCF Pegasus Distinguished Professor and Lockheed Martin St. Laurent Professor. His current research interests are Micro/nanoelectronics computer-aided design, RF device modeling and simulation, and electrostatic discharge (ESD) protection design and simulation.

Dr. Liou holds 8 U.S. patents (3 more filed and pending), and has published 10 books, more than 260 journal papers (including 17 invited review articles), and more than 210 papers (including more than 90 keynote and invited papers) in international and national conference proceedings. He has been awarded more than $12.0 million of research contracts and grants from federal agencies (i.e., NSF, DARPA, Navy, Air Force, NASA, NIST), state government, and industry (i.e., Semiconductor Research Corp., Intel Corp., Intersil Corp., Lucent Technologies, Alcatel Space, Conexant Systems, Texas Instruments, Fairchild Semiconductor, National Semiconductor, Analog Devices, Maxim, RF Micro Device, Lockheed Martin), and has held consulting positions with research laboratories and companies in the United States, China, Japan, Taiwan, and Singapore. In addition, Dr. Liou has served as a technical reviewer for various journals and publishers, general chair or technical program chair for a large number of international conferences, regional editor (in USA, Canada and South America) of the Microelectronics Reliability journal, and guest editor of 3 special issues in the Microelectronics Reliability and Solid-State Electronics.

Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida (UCF) and six different awards from the IEEE. Among them, he was awarded the UCF Pegasus Distinguished Professor (2009) - the highest honor bestowed to a faculty member at UCF - UCF Distinguished Researcher Award (four times: 1992, 1998, 2002, 2009) - the most of any faculty in the history of UCF - UCF Research Incentive Award (three times: 2000, 2005, 2010), UCF Trustee Chair Professor (2002), and IEEE Joseph M. Biedenbach Outstanding Engineering Educator Award in 2004 for his exemplary teaching, research, and international collaboration. His other honors are Fellow of IEEE, Fellow of IET, Fellow of Singapore Institute of Manufacturing Technology, Fellow of UCF-Analog Devices, Distinguished Lecturer of IEEE Electron Device Society (EDS), and Distinguished Lecturer of National Science Council. He holds several honorary professorships, including Chang Jiang Scholar Endowed Professor of Ministry of Education, China - the highest honorary professorship in China - NSVL Distinguished Professor of National Semiconductor Corp., USA, International Honorary Chair Professor, National Taipei University of Technology, Taiwan, Chang Gung Endowed Professor of Chang Gung University, Taiwan, Feng Chia Chair Professor of Feng Chia University, Taiwan, Chunhui Eminent Scholar of Peking University, China, Cao Guang-Biao Endowed Professor of Zhejiang University, China, Honorary Professor of Xidian University, China, Consultant Professor of Huazhong University of Science and Technology, China, and Courtesy Professor of Shanghai Jiao Tong University, China. Dr. Liou was a recipient of U.S. Air Force Fellowship Award and National University Singapore Fellowship Award.

Dr. Liou has served as the IEEE EDS Vice-President of Regions/Chapters, IEEE EDS Treasurer, IEEE EDS Finance Committee Chair, Member of IEEE EDS Board of Governors, and Member of IEEE EDS Educational Activities Committee.


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